Electrical Modes in Scanning Probe Microscopy

Publication type:
Journal article
Metadata:
Autoren
  • Ruediger Berger
  • Hans-Juergen Butt
  • Maria B Retschke
  • Stefan AL Weber
Autoren-URL
https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=fis-test-1&SrcAuth=WosAPI&KeyUT=WOS:000268553000003&DestLinkType=FullRecord&DestApp=WOS_CPL
DOI
10.1002/marc.200900220
eISSN
1521-3927
Externe Identifier
  • Clarivate Analytics Document Solution ID: 477XT
  • PubMed Identifier: 21638372
ISSN
1022-1336
Ausgabe der Veröffentlichung
14
Zeitschrift
MACROMOLECULAR RAPID COMMUNICATIONS
Schlüsselwörter
  • atomic force microscopy (AFM)
  • focused ion beam
  • microscopy
  • microwave
  • torsion mode
  • scanning probe
Paginierung
1167 - 1178
Datum der Veröffentlichung
2009
Status
Published
Titel
Electrical Modes in Scanning Probe Microscopy
Sub types
  • Review
Ausgabe der Zeitschrift
30

Data source: Web of Science (Lite)

Other metadata sources:
Abstract
<jats:title>Abstract</jats:title><jats:p>Scanning probe microscopy methods allow the investigation of a variety of sample surface properties on a nanometer scale, even down to single molecules. As molecular electronics advance, the characterization of electrical properties becomes more and more important. In both research and industry, films made from composite materials and lithographically structured elements have already reached structure sizes down to a few nanometers. Here, we review the major scanning probe microscopy modes that are used for electrical characterization of thin films, that is, scanning conductive force microscopy, Kelvin probe force microscopy and scanning electric field microscopy. To demonstrate the possibilities and capabilities of these modes, reference samples were fabricated by means of focused ion beam deposition and analyzed using the described methods. Furthermore, two upcoming modes are presented that are based on: i) local current measurements while the SPM‐cantilever is excited into torsional vibrations, and, ii) changes in a backscattered microwave that was coupled into a scanning probe microscopy‐cantilever. The scanning‐probe‐based electrical modes are applicable for studies of functional layers used in soft matter electronic devices under realistic environmental conditions.</jats:p><jats:p><jats:boxed-text content-type="graphic" position="anchor"><jats:graphic xmlns:xlink="http://www.w3.org/1999/xlink" mimetype="image/jpeg" position="anchor" specific-use="enlarged-web-image" xlink:href="graphic/mgra001.jpg"><jats:alt-text>magnified image</jats:alt-text></jats:graphic></jats:boxed-text> </jats:p>
Autoren
  • Rüdiger Berger
  • Hans‐Jürgen Butt
  • Maria B Retschke
  • Stefan AL Weber
DOI
10.1002/marc.200900220
eISSN
1521-3927
ISSN
1022-1336
Ausgabe der Veröffentlichung
14
Zeitschrift
Macromolecular Rapid Communications
Sprache
en
Online publication date
2009
Paginierung
1167 - 1178
Datum der Veröffentlichung
2009
Status
Published
Herausgeber
Wiley
Herausgeber URL
http://dx.doi.org/10.1002/marc.200900220
Datum der Datenerfassung
2023
Titel
Electrical Modes in Scanning Probe Microscopy
Ausgabe der Zeitschrift
30

Data source: Crossref

Abstract
Scanning probe microscopy methods allow the investigation of a variety of sample surface properties on a nanometer scale, even down to single molecules. As molecular electronics advance, the characterization of electrical properties becomes more and more important. In both research and industry, films made from composite materials and lithographically structured elements have already reached structure sizes down to a few nanometers. Here, we review the major scanning probe microscopy modes that are used for electrical characterization of thin films, that is, scanning conductive force microscopy, Kelvin probe force microscopy and scanning electric field microscopy. To demonstrate the possibilities and capabilities of these modes, reference samples were fabricated by means of focused ion beam deposition and analyzed using the described methods. Furthermore, two upcoming modes are presented that are based on: i) local current measurements while the SPM-cantilever is excited into torsional vibrations, and, ii) changes in a backscattered microwave that was coupled into a scanning probe microscopy-cantilever. The scanning-probe-based electrical modes are applicable for studies of functional layers used in soft matter electronic devices under realistic environmental conditions.
Addresses
  • Max Planck Institute for Polymer Research, 55128 Mainz, Germany. berger@mpip-mainz.mpg.de.
Autoren
  • Rüdiger Berger
  • Hans-Jürgen Butt
  • Maria B Retschke
  • Stefan AL Weber
DOI
10.1002/marc.200900220
eISSN
1521-3927
Externe Identifier
  • PubMed Identifier: 21638372
Open access
false
ISSN
1022-1336
Ausgabe der Veröffentlichung
14
Zeitschrift
Macromolecular rapid communications
Sprache
eng
Medium
Print-Electronic
Online publication date
2009
Paginierung
1167 - 1178
Datum der Veröffentlichung
2009
Status
Published
Datum der Datenerfassung
2011
Titel
Electrical modes in scanning probe microscopy.
Sub types
  • Journal Article
Ausgabe der Zeitschrift
30

Data source: Europe PubMed Central

Abstract
Scanning probe microscopy methods allow the investigation of a variety of sample surface properties on a nanometer scale, even down to single molecules. As molecular electronics advance, the characterization of electrical properties becomes more and more important. In both research and industry, films made from composite materials and lithographically structured elements have already reached structure sizes down to a few nanometers. Here, we review the major scanning probe microscopy modes that are used for electrical characterization of thin films, that is, scanning conductive force microscopy, Kelvin probe force microscopy and scanning electric field microscopy. To demonstrate the possibilities and capabilities of these modes, reference samples were fabricated by means of focused ion beam deposition and analyzed using the described methods. Furthermore, two upcoming modes are presented that are based on: i) local current measurements while the SPM-cantilever is excited into torsional vibrations, and, ii) changes in a backscattered microwave that was coupled into a scanning probe microscopy-cantilever. The scanning-probe-based electrical modes are applicable for studies of functional layers used in soft matter electronic devices under realistic environmental conditions.
Date of acceptance
2009
Autoren
  • Rüdiger Berger
  • Hans-Jürgen Butt
  • Maria B Retschke
  • Stefan AL Weber
Autoren-URL
https://www.ncbi.nlm.nih.gov/pubmed/21638372
DOI
10.1002/marc.200900220
eISSN
1521-3927
Ausgabe der Veröffentlichung
14
Zeitschrift
Macromol Rapid Commun
Sprache
eng
Country
Germany
Paginierung
1167 - 1178
Datum der Veröffentlichung
2009
Status
Published
Datum, an dem der Datensatz öffentlich gemacht wurde
2012
Titel
Electrical modes in scanning probe microscopy.
Sub types
  • Journal Article
Ausgabe der Zeitschrift
30

Data source: PubMed

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