Open loop Kelvin probe force microscopy with single and multi-frequency excitation
- Publication type:
- Journal article
- Metadata:
-
- Autoren
- L Collins
- JI Kilpatrick
- SAL Weber
- A Tselev
- IV Vlassiouk
- IN Ivanov
- S Jesse
- SV Kalinin
- BJ Rodriguez
- Autoren-URL
- https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=fis-test-1&SrcAuth=WosAPI&KeyUT=WOS:000326816600016&DestLinkType=FullRecord&DestApp=WOS_CPL
- DOI
- 10.1088/0957-4484/24/47/475702
- eISSN
- 1361-6528
- Externe Identifier
- Clarivate Analytics Document Solution ID: 249YI
- PubMed Identifier: 24176878
- ISSN
- 0957-4484
- Ausgabe der Veröffentlichung
- 47
- Zeitschrift
- NANOTECHNOLOGY
- Artikelnummer
- ARTN 475702
- Datum der Veröffentlichung
- 2013
- Status
- Published
- Titel
- Open loop Kelvin probe force microscopy with single and multi-frequency excitation
- Sub types
- Article
- Ausgabe der Zeitschrift
- 24
Data source: Web of Science (Lite)
- Other metadata sources:
-
- Autoren
- L Collins
- JI Kilpatrick
- SAL Weber
- A Tselev
- IV Vlassiouk
- IN Ivanov
- S Jesse
- SV Kalinin
- BJ Rodriguez
- DOI
- 10.1088/0957-4484/24/47/475702
- eISSN
- 1361-6528
- ISSN
- 0957-4484
- Ausgabe der Veröffentlichung
- 47
- Zeitschrift
- Nanotechnology
- Online publication date
- 2013
- Paginierung
- 475702 - 475702
- Datum der Veröffentlichung
- 2013
- Status
- Published
- Herausgeber
- IOP Publishing
- Herausgeber URL
- http://dx.doi.org/10.1088/0957-4484/24/47/475702
- Datum der Datenerfassung
- 2020
- Titel
- Open loop Kelvin probe force microscopy with single and multi-frequency excitation
- Ausgabe der Zeitschrift
- 24
Data source: Crossref
- Abstract
- Conventional Kelvin probe force microscopy (KPFM) relies on closed loop (CL) bias feedback for the determination of surface potential (SP). However, SP measured by CL-KPFM has been shown to be strongly influenced by the choice of measurement parameters due to non-electrostatic contributions to the input signal of the bias feedback loop. This often leads to systematic errors of several hundred mV and can also result in topographical crosstalk. Here, open loop (OL)-KPFM modes are investigated as a means of obtaining a quantitative, crosstalk free measurement of the SP of graphene grown on Cu foil, and are directly contrasted with CL-KPFM. OL-KPFM operation is demonstrated in both single and multi-frequency excitation regimes, yielding quantitative SP measurements. The SP difference between single and multilayer graphene structures using OL-KPFM was found to be 63 ± 11 mV, consistent with values previously reported by CL-KPFM. Furthermore, the same relative potential difference between Al2O3-coated graphene and Al2O3-coated Cu was observed using both CL and OL techniques. We observed an offset of 55 mV between absolute SP values obtained by OL and CL techniques, which is attributed to the influence of non-electrostatic contributions to the input of the bias feedback used in CL-KPFM.
- Addresses
- School of Physics, University College Dublin, Belfield, Dublin 4, Ireland. Conway Institute of Biomedical and Biomolecular Research, University College Dublin, Belfield, Dublin 4, Ireland.
- Autoren
- L Collins
- JI Kilpatrick
- SAL Weber
- A Tselev
- IV Vlassiouk
- IN Ivanov
- S Jesse
- SV Kalinin
- BJ Rodriguez
- DOI
- 10.1088/0957-4484/24/47/475702
- eISSN
- 1361-6528
- Externe Identifier
- PubMed Identifier: 24176878
- Open access
- false
- ISSN
- 0957-4484
- Ausgabe der Veröffentlichung
- 47
- Zeitschrift
- Nanotechnology
- Sprache
- eng
- Medium
- Print-Electronic
- Online publication date
- 2013
- Paginierung
- 475702
- Datum der Veröffentlichung
- 2013
- Status
- Published
- Datum der Datenerfassung
- 2013
- Titel
- Open loop Kelvin probe force microscopy with single and multi-frequency excitation.
- Sub types
- Research Support, Non-U.S. Gov't
- Research Support, U.S. Gov't, Non-P.H.S.
- Journal Article
- Ausgabe der Zeitschrift
- 24
Data source: Europe PubMed Central
- Abstract
- Conventional Kelvin probe force microscopy (KPFM) relies on closed loop (CL) bias feedback for the determination of surface potential (SP). However, SP measured by CL-KPFM has been shown to be strongly influenced by the choice of measurement parameters due to non-electrostatic contributions to the input signal of the bias feedback loop. This often leads to systematic errors of several hundred mV and can also result in topographical crosstalk. Here, open loop (OL)-KPFM modes are investigated as a means of obtaining a quantitative, crosstalk free measurement of the SP of graphene grown on Cu foil, and are directly contrasted with CL-KPFM. OL-KPFM operation is demonstrated in both single and multi-frequency excitation regimes, yielding quantitative SP measurements. The SP difference between single and multilayer graphene structures using OL-KPFM was found to be 63 ± 11 mV, consistent with values previously reported by CL-KPFM. Furthermore, the same relative potential difference between Al2O3-coated graphene and Al2O3-coated Cu was observed using both CL and OL techniques. We observed an offset of 55 mV between absolute SP values obtained by OL and CL techniques, which is attributed to the influence of non-electrostatic contributions to the input of the bias feedback used in CL-KPFM.
- Autoren
- L Collins
- JI Kilpatrick
- SAL Weber
- A Tselev
- IV Vlassiouk
- IN Ivanov
- S Jesse
- SV Kalinin
- BJ Rodriguez
- Autoren-URL
- https://www.ncbi.nlm.nih.gov/pubmed/24176878
- DOI
- 10.1088/0957-4484/24/47/475702
- eISSN
- 1361-6528
- Ausgabe der Veröffentlichung
- 47
- Zeitschrift
- Nanotechnology
- Sprache
- eng
- Country
- England
- Paginierung
- 475702
- Datum der Veröffentlichung
- 2013
- Status
- Published
- Datum, an dem der Datensatz öffentlich gemacht wurde
- 2014
- Titel
- Open loop Kelvin probe force microscopy with single and multi-frequency excitation.
- Sub types
- Journal Article
- Research Support, Non-U.S. Gov't
- Research Support, U.S. Gov't, Non-P.H.S.
- Ausgabe der Zeitschrift
- 24
Data source: PubMed
- Beziehungen:
-