Scanning Electron Microscopy with Polarisation Analysis
- Publication type:
- Journal article
- Metadata:
-
- Abstract
- <jats:title>Abstract</jats:title> <jats:p>The scanning electron microscope with polarization analysis (SEMPA or spin‐SEM) is a powerful tool to investigate the magnetic structure of ferromagnetic surfaces with high spatial resolution. In the article the spin polarized secondary electron emission is described and discussed as the contrast generating process that is utilized in SEMPA. Taking the secondary electron emission from itinerant ferromagnets as starting point, the properties and best case performance of spin‐SEM are derived. The consequences of these properties for the realization of such a microscope and the polarization analyzer, as well as the resulting strengths and weaknesses of the technique are discussed. The best case performance is compared to the actual performance of a newly designed microscope. Several examples for the application of spin‐SEM are presented; e.g. the study of the spin‐reorientation transition in ultrathin films and interlayer exchange coupling. It is shown how a decoration technique can be used to analyze ferromagnets where the surface is non‐magnetic due to contamination or capping by a protective layer. Finally, the influence of sample morphology on the polarization detection and details of the analysis of the vectorial polarization measurement are comprehensively discussed.</jats:p>
- Autoren
- Hans Peter Oepen
- Robert Frömter
- DOI
- 10.1002/9780470022184.hmm309
- Sprache
- en
- Online publication date
- 2007
- Datum der Veröffentlichung
- 2007
- Status
- Published
- Herausgeber
- Wiley
- Herausgeber URL
- http://dx.doi.org/10.1002/9780470022184.hmm309
- Datum der Datenerfassung
- 2023
- Titel
- Scanning Electron Microscopy with Polarisation Analysis
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