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1. Measurement of the inclusive semielectronic D-0 branching fraction

Autoren:
Kubota, Y; Lattery, M; Nelson, JK; Patton, S; Poling, R; Riehle, T; Savinov, V; Wang, R; Alam, MS; Kim, IJ; Ling, Z; Mahmood, AH; ONeill, JJ; Severini, H; Sun, CR; Timm, S; Wappler, F; Crawford, G; Duboscq, JE; Fulton, R; Fujino, D; Gan, KK; Honscheid, K; Kagan, H; Kass, R; Lee, J; Sung, M; White, C; Wanke, R; Wolf, A; Zoeller, MM; Fu, X; Nemati, B; Ross, WR; Skubic, P; Wood, M; Bishai, M; Fast, J; Gerndt, E; Hinson, JW; Miao, T; Miller, DH; Modesitt, M; Shibata, EI; Shipsey, IPJ; Wang, PN; Gibbons, L; Johnson, SD; Kwon, Y; Roberts, S; Thorndike, EH; Coan, TE; Dominick, J; Fadeyev, V; Korolkov, I; Lambrecht, M; Sanghera, S; Shelkov, V; Stroynowski, R; Volobouev, I; Wei, G; Artuso, M; Gao, M; Goldberg, M; He, D; Horwitz, N; Kopp, S; Moneti, GC; Mountain, R; Muheim, F; Mukhin, Y; Playfer, S; Skwarnicki, T; Stone, S; Xing, X; Bartelt, J; Csorna, SE; Jain, V; Marka, S; Gibaut, D; Kinoshita, K; Pomianowski, P; Schrenk, S; Barish, B; Chadha, M; Chan, S; Cowen, DF; Eigen, G; Miller, JS; OGrady, C; Urheim, J; Weinstein, AJ; Wurthwein, F; Asner, DM; Athanas, M; Bliss, DW; Brower, WS; Masek, G; Paar, HP; Gronberg, J
Type:
Journal article