Mapping of Local Conductivity Variations on Fragile Nanopillar Arrays by Scanning Conductive Torsion Mode Microscopy

Publikationstyp:
Zeitschriftenaufsatz
Metadaten:
Autoren
  • Stefan AL Weber
  • Niko Haberkorn
  • Patrick Theato
  • Ruediger Berger
Autoren-URL
https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=fis-test-1&SrcAuth=WosAPI&KeyUT=WOS:000276557100018&DestLinkType=FullRecord&DestApp=WOS_CPL
DOI
10.1021/nl9035274
eISSN
1530-6992
Externe Identifier
  • Clarivate Analytics Document Solution ID: 581WU
  • PubMed Identifier: 20235512
ISSN
1530-6984
Ausgabe der Veröffentlichung
4
Zeitschrift
NANO LETTERS
Schlüsselwörter
  • Anodized aluminum oxide template
  • organic semiconductor
  • conductive scanning force microscopy
  • nanopillar array
Paginierung
1194 - 1197
Datum der Veröffentlichung
2010
Status
Published
Titel
Mapping of Local Conductivity Variations on Fragile Nanopillar Arrays by Scanning Conductive Torsion Mode Microscopy
Sub types
  • Article
Ausgabe der Zeitschrift
10

Datenquelle: Web of Science (Lite)

Andere Metadatenquellen:
Autoren
  • Stefan AL Weber
  • Niko Haberkorn
  • Patrick Theato
  • Rüdiger Berger
DOI
10.1021/nl9035274
eISSN
1530-6992
ISSN
1530-6984
Ausgabe der Veröffentlichung
4
Zeitschrift
Nano Letters
Sprache
en
Online publication date
2010
Paginierung
1194 - 1197
Datum der Veröffentlichung
2010
Status
Published
Herausgeber
American Chemical Society (ACS)
Herausgeber URL
http://dx.doi.org/10.1021/nl9035274
Datum der Datenerfassung
2023
Titel
Mapping of Local Conductivity Variations on Fragile Nanopillar Arrays by Scanning Conductive Torsion Mode Microscopy
Ausgabe der Zeitschrift
10

Datenquelle: Crossref

Abstract
A gentle method that combines torsion mode topography imaging with conductive scanning force microscopy is presented. By applying an electrical bias voltage between tip and sample surface, changes in the local sample conductivity can be mapped. The topography and local conductivity variations on fragile free-standing nanopillar arrays were investigated. These samples were fabricated by an anodized aluminum oxide template process using a thermally cross-linked triphenylamine-derivate semiconductor. The nanoscale characterization method is shown to be nondestructive. Individual nanopillars were clearly resolved in topography and current images that were recorded simultaneously. Local current-voltage characteristics suggest a space-charge limited conduction in the semiconducting nanopillars.
Addresses
  • Max Planck Institute for Polymer Research, Mainz, Germany.
Autoren
  • Stefan AL Weber
  • Niko Haberkorn
  • Patrick Theato
  • Rüdiger Berger
DOI
10.1021/nl9035274
eISSN
1530-6992
Externe Identifier
  • PubMed Identifier: 20235512
Open access
false
ISSN
1530-6984
Ausgabe der Veröffentlichung
4
Zeitschrift
Nano letters
Schlüsselwörter
  • Aluminum Oxide
  • Aniline Compounds
  • Microscopy, Electron, Scanning
  • Materials Testing
  • Electric Conductivity
  • Surface Properties
  • Semiconductors
  • Nanotechnology
  • Nanotubes
Sprache
eng
Medium
Print
Paginierung
1194 - 1197
Datum der Veröffentlichung
2010
Status
Published
Datum der Datenerfassung
2010
Titel
Mapping of local conductivity variations on fragile nanopillar arrays by scanning conductive torsion mode microscopy.
Sub types
  • Research Support, Non-U.S. Gov't
  • Journal Article
Ausgabe der Zeitschrift
10

Datenquelle: Europe PubMed Central

Abstract
A gentle method that combines torsion mode topography imaging with conductive scanning force microscopy is presented. By applying an electrical bias voltage between tip and sample surface, changes in the local sample conductivity can be mapped. The topography and local conductivity variations on fragile free-standing nanopillar arrays were investigated. These samples were fabricated by an anodized aluminum oxide template process using a thermally cross-linked triphenylamine-derivate semiconductor. The nanoscale characterization method is shown to be nondestructive. Individual nanopillars were clearly resolved in topography and current images that were recorded simultaneously. Local current-voltage characteristics suggest a space-charge limited conduction in the semiconducting nanopillars.
Autoren
  • Stefan AL Weber
  • Niko Haberkorn
  • Patrick Theato
  • Rüdiger Berger
Autoren-URL
https://www.ncbi.nlm.nih.gov/pubmed/20235512
DOI
10.1021/nl9035274
eISSN
1530-6992
Ausgabe der Veröffentlichung
4
Zeitschrift
Nano Lett
Schlüsselwörter
  • Aluminum Oxide
  • Aniline Compounds
  • Electric Conductivity
  • Materials Testing
  • Microscopy, Electron, Scanning
  • Nanotechnology
  • Nanotubes
  • Semiconductors
  • Surface Properties
Sprache
eng
Country
United States
Paginierung
1194 - 1197
Datum der Veröffentlichung
2010
Status
Published
Datum, an dem der Datensatz öffentlich gemacht wurde
2010
Titel
Mapping of local conductivity variations on fragile nanopillar arrays by scanning conductive torsion mode microscopy.
Sub types
  • Journal Article
  • Research Support, Non-U.S. Gov't
Ausgabe der Zeitschrift
10

Datenquelle: PubMed

Beziehungen:
Eigentum von

Werkzeuge