PEEM with high time resolution -: imaging of transient processes and novel concepts of chromatic and spherical aberration correction

Publikationstyp:
Konferenzbeitrag
Metadaten:
Autoren
  • G Schoenhense
  • HJ Elmers
Autoren-URL
https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=fis-test-1&SrcAuth=WosAPI&KeyUT=WOS:000243303500012&DestLinkType=FullRecord&DestApp=WOS_CPL
DOI
10.1002/sia.2433
Externe Identifier
  • Clarivate Analytics Document Solution ID: 123NV
ISSN
0142-2421
Ausgabe der Veröffentlichung
12-13
Zeitschrift
SURFACE AND INTERFACE ANALYSIS
Schlüsselwörter
  • stroboscopic imaging
  • PEEM
  • synchrotron radiation
  • time-resolved image detection
  • aberration correction
Paginierung
1578 - 1587
Datum der Veröffentlichung
2006
Status
Published
Titel
PEEM with high time resolution -: imaging of transient processes and novel concepts of chromatic and spherical aberration correction
Ausgabe der Zeitschrift
38

Datenquelle: Web of Science (Lite)

Andere Metadatenquellen:
Abstract
<jats:title>Abstract</jats:title><jats:p>The potential of time‐resolved photoemission electron microscopy (PEEM) for imaging ultrafast processes and for aberration correction in full‐field imaging is discussed. In particular, we focus on stroboscopic imaging of precessional magnetic excitations via XMCD‐PEEM exploiting the time structure of synchrotron radiation (magnetic field pulse pump–X‐ray probe). In a special bunch‐compression mode at BESSY, a time resolution of about 15 ps has been obtained. Further, we discuss an all‐optical pump–probe technique using femtosecond laser excitation. A highly promising alternative to stroboscopic imaging is an approach using time‐resolved image detection. As a second application of time‐resolved PEEM we discuss potential ways of aberration correction. These approaches go back to the old ideas of Scherzer in the light of state‐of‐the‐art equipment. The excellent time structure of synchrotron radiation or pulsed lasers along with advanced methods of time‐resolved image detection and fast electronic pulsers opens ways for driving the resolution limit of a PEEM into the range of a few nanometers. Copyright © 2006 John Wiley &amp; Sons, Ltd.</jats:p>
Autoren
  • G Schönhense
  • HJ Elmers
DOI
10.1002/sia.2433
eISSN
1096-9918
ISSN
0142-2421
Ausgabe der Veröffentlichung
12-13
Zeitschrift
Surface and Interface Analysis
Online publication date
2006
Paginierung
1578 - 1587
Datum der Veröffentlichung
2006
Status
Published
Herausgeber
Wiley
Herausgeber URL
http://dx.doi.org/10.1002/sia.2433
Datum der Datenerfassung
2023
Titel
PEEM with high time resolution—imaging of transient processes and novel concepts of chromatic and spherical aberration correction
Ausgabe der Zeitschrift
38

Datenquelle: Crossref

Beziehungen:
Eigentum von

Werkzeuge